Controlling back scattering in optical waveguide systems

ABSTRACT

Back scattering in an optical waveguide at an operating wavelength is controlled by adjusting an optical phase of light propagating in the waveguide at one or more locations along the waveguide. A portion of the back scattered light is tapped off near an input port and coupled into a photodetector. A controller detects changes in the photodetector signal and adjusts an optical phase tuner configured to control the optical phase of light in the waveguide at the selected location or locations. The optical phase tuner may be configured to vary the refractive index of at least a portion of the waveguide.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.16/171,917, now allowed, which is a continuation of U.S. patentapplication Ser. No. 15/481,971, filed Apr. 7, 2017, now U.S. Pat. No.10,133,014, which are hereby incorporated by reference herein in theirentireties.

FIELD OF THE INVENTION

The invention generally relates to photonic integrated circuits, andmore particularly relates to an apparatus and method for an automatedcontrol of back scattering in optical waveguides.

BACKGROUND OF THE INVENTION

Rayleigh scattering from small defects and material non-uniformities inan optical waveguide can lead to significant amounts of optical backreflection, when part of the light propagating in the waveguide isreflected and propagates back towards the input. This back scatteringmay be particularly significant in high index contrast waveguidesystems, where the surface roughness of the waveguide core may scatterlight with a higher efficiency. Optical systems built in high indexcontrast material systems, such as for example silicon-on-isolator(SOI), can have relatively long waveguides and thus exhibit high levelsback scattering. This back scattering may be a problem for othercomponents in an optical system, such as for example laser diodes anderbium doped fiber amplifiers (EDFA), for which back reflected light maycause linewidth broadening and/or output power oscillations.

It is often difficult to reduce back scattering through changes in thewaveguide fabrication process that improve the surface roughness ofwaveguides. Thus, a technique that can effectively reduce undesired backreflection in optical waveguide systems and devices with conventionalwaveguides to an acceptable level without appreciably affecting opticalsignal quality may be preferred.

Back reflections from a waveguide may be suppressed for example usingoptical isolators. However, a typical optical isolator is a relativelybig component and its use may require additional opticalsplices/connections. Optical isolators may also require exoticmaterials, and typically require lenses. All these factors maysignificantly increase the size and cost of the system.

Back reflections may also be reduced by utilizing specific waveguidemodes or by changing the waveguide geometry to reduce sensitivity to thesurface roughness. However this does not typically provide sufficientimprovement in back scattering, and may impose additional designtrade-offs.

Accordingly, it may be understood that there may be significant problemsand shortcomings associated with current solutions and technologies forcontrolling back reflections in optical waveguide systems.

SUMMARY OF THE INVENTION

Accordingly, one aspect of the present disclosure relates to a methodfor controlling back scattering in an optical waveguide systemcomprising at least one optical waveguide having an input port, said atleast one optical waveguide defining an optical waveguide path for lightinjected in the input optical port. The method may comprise:

a) injecting input light into the input port of the at least one opticalwaveguide, the input light partially converting into backscattered lightas the input light propagates away from the input port in the at leastone optical waveguide, the back scattered light propagating towards theinput port;

b) tapping off a portion of the back scattered light to form firsttapped-off light;

c) coupling the first tapped-off light into a first photodetector (PD);

d) measuring a first electrical PD signal from the first PD, said firstelectrical PD signal being responsive to the first tapped-off lightreceived by the first PD; and,

e) acting upon the at least one waveguide so as to vary an optical phaseof the backscattered light at one or more waveguide locations along theat least one optical waveguide in dependence upon the first electricalPD signal from the first PD, or a signal derived at least in parttherefrom, so as to control an optical power of the tapped off portionof the backscattered light.

In some implementations the method may comprises tapping off the portionof the back scattered light to form first tapped-off light at or nearthe input port, and varying the optical phase of the backscattered lightin dependence at least in part upon the first electrical PD signal so asto decrease, or at least stabilize, the optical power of thebackscattered light at the input port.

One aspect of the present disclosure provides an optical waveguidesystem comprising: an input port configured to receive input light; atleast one optical waveguide disposed to guide the input light from theinput port along an optical waveguide path, the input light beingpartially converted into backscattered light while propagating in the atleast one optical waveguide, the back scattered light propagatingtowards the input port; a first photodetector (PD) configured to providea first electrical PD signal responsive to light received by the firstPD; a coupler disposed to tap off a portion of the backscattered lightat or near the input port and configured to couple said portion into thefirst PD; and, at least one optical phase tuner configured to act uponthe at least one optical waveguide so as to vary an optical phase oflight propagating therein at one or more locations along the at leastone optical waveguide in response to one or more electrical controlsignals, so as to control an optical power of the tapped off portion ofthe backscattered light.

In accordance with an aspect of the present disclosure, the apparatusmay include a controller electrically connected to the first PD and theoptical phase tuner and configured to adjust the one or more electricalcontrol signals so as to minimize or at least decrease the firstelectrical PD signal or a signal derived at least in part therefrom.

The apparatus may further include a second PD coupled to the at leastone optical waveguide to receive a portion of the input light, and togenerate a second PD signal responsive thereto, and the controller maybe configure to measure changes in an optical return loss of the atleast one optical waveguide based on the first and second electrical PDsignals, and to adjust the one or more electrical control signals so asto minimize or at least decrease the optical return loss.

One aspect of the present disclosure provides a method for controllingback scattering in an optical waveguide system comprising at least oneoptical waveguide having an input port, the method comprising: a)injecting input light into the input port of the at least one opticalwaveguide, the input light partially converting into backscattered lightas the input light propagates away from the input port in the at leastone optical waveguide, the back scattered light propagating towards theinput port; b) acting upon the at least one waveguide so as to dither anoptical phase of the backscattered light at one or more locations alongthe at least one optical waveguide with a dither amplitude that issufficient to maintain a time-averaged optical power of thebackscattered light at the output port at a substantially constant levelwithin an operating temperature range of the optical waveguide system.In some implementations the method may include locally modulating theoptical phase of the backscattered light at a location along the opticalwaveguide that is selected so as to enable at least 3 dB variation of aninstantaneous optical power of the back-scattered light by themodulating.

BRIEF DESCRIPTION OF THE DRAWINGS

Embodiments disclosed herein will be described in greater detail withreference to the accompanying drawings, which may be not to scale and inwhich like elements are indicated with like reference numerals, andwherein:

FIG. 1A is a schematic diagram of an optical waveguide illustratingforward and back scattered light and an optical phase shift at a middlepoint.

FIG. 1B is a plot of an example waveguide backscattering spectrum.

FIG. 2 is a schematic diagram of a system for an automated control ofoptical back scattering in a waveguide device.

FIG. 3 is a schematic block diagram of an embodiment of the system ofFIG. 2 with a local optical phase shifter disposed between two waveguidesections.

FIG. 4 is a schematic block diagram illustrating multiple local opticalphase shifters interspersed between multiple waveguide sections forcontrolling optical back scattering in the waveguide device.

FIG. 5 is a schematic block diagram of an embodiment of the system ofFIG. 2 with an optical filter in the feedback loop to selectivelycontrol back scattering at a sub-set of input wavelengths.

FIG. 6 is a schematic block diagram of an embodiment of the system ofFIG. 5 with a light terminating device.

FIG. 7 is a schematic diagram of one embodiment of the system of FIG. 2using a micro-ring resonator as an input optical coupler for tapping offbackscattered light.

FIG. 8 is a schematic diagram of one embodiment of the system of FIG. 2using a TEC or an electric heater in the backscatter control feedbackloop to adjust the temperature of the waveguide.

FIG. 9 is a schematic diagram of an embodiment of the system of FIG. 8using a TEC or an electric heater in the backscatter control feedbackloop to adjust the temperature of the chip.

FIG. 10 is plot of an example dependence of a thermal shift of thebackscattering spectrum on device temperature.

FIG. 11 is a flowchart of a method for an automatic suppression orcontrol of waveguide back scattering by a feedback adjusting an opticalphase in the waveguide path.

FIG. 12 is a flowchart of a method for an automatic stabilization of anaverage return optical loss by dithering an optical phase in thewaveguide.

FIG. 13A is a schematic diagram illustrating an optical phase shifterembodied as a resistive electrical heater disposed over a section of awaveguide.

FIG. 13B is a schematic diagram illustrating an optical phase shifterembodied as a p/n junction formed across a section of a waveguide.

FIG. 13C is a schematic diagram illustrating an optical phase shifterembodied with electrical contacts disposed for applying a voltage acrossa section of a waveguide.

FIG. 13D is a schematic diagram illustrating an optical waveguide pathwith a sequence of electrodes disposed along its length so as to enableadding tunable phase shifts at various locations along the waveguidepath.

FIG. 14A is a graph illustrating a simulated distribution of attainableRL improvement across a plurality of operating wavelengths for variouslocations of the optical phase shifter along a 2 cm long waveguide withoptical loss of 2 dB/cm.

FIG. 14B is a box plot illustrating a simulated distribution ofattainable RL improvement across a plurality of operating wavelengthsfor various locations of the optical phase shifter along a 2 cm longwaveguide with optical loss of 5 dB/cm.

FIG. 14C is a graph illustrating a simulated distribution of attainableRL improvement across a plurality of operating wavelengths for variouslocations of the optical phase shifter along a 2 cm long waveguide withoptical loss of 10 dB/cm.

FIG. 14D is a graph illustrating a simulated distribution of attainableRL improvement across a plurality of operating wavelengths for variouslocations of the optical phase shifter along a 2 cm long waveguide withoptical loss of 20 dB/cm.

DETAILED DESCRIPTION OF THE INVENTION

In the following description, for purposes of explanation and notlimitation, specific details are set forth, such as particular opticalcircuits, circuit components, techniques, etc. in order to provide athorough understanding of the present invention. However, it will beapparent to one skilled in the art that the present invention may bepracticed in other embodiments that depart from these specific details.In other instances, detailed descriptions of well-known methods,devices, and circuits are omitted so as not to obscure the descriptionof the present invention. All statements herein reciting principles,aspects, and embodiments of the invention, as well as specific examplesthereof, are intended to encompass both structural and functionalequivalents thereof. Additionally, it is intended that such equivalentsinclude both currently known equivalents as well as equivalentsdeveloped in the future, i.e., any elements developed that perform thesame function, regardless of structure.

Furthermore, the following abbreviations and acronyms may be used in thepresent document:

CMOS Complementary Metal-Oxide-Semiconductor

GaAs Gallium Arsenide

InP Indium Phosphide

LiNO₃ Lithium Niobate

PIC Photonic Integrated Circuits

SOI Silicon on Insulator

PLC Planar Lightwave Circuit

Note that as used herein, the terms “first”, “second” and so forth arenot intended to imply sequential ordering, but rather are intended todistinguish one element from another, unless explicitly stated.Similarly, sequential ordering of method steps does not imply asequential order of their execution, unless explicitly stated. The word‘using’, when used in relation to a method or process performed by anoptical element, device, or sub-system, is to be understood as referringto an action performed by the respective optical element, device, orsub-system itself, or by a component thereof, and/or possibly by acontroller included in the system, rather than by an external agent. Theterm “optical waveguide” may refer to planar and non-planar opticalwaveguides, and encompasses branching optical waveguides, such as butnot exclusively those forming Mach-Zehnder waveguide structures andarray waveguide gratings, and optical waveguides incorporatingfunctional elements such as splitters, combiners, filters, waveguideamplifiers, waveguide modulators, etc. Furthermore the term ‘opticalwaveguide’, as used herein, may encompass a waveguide path that spanstwo or more chips, or comprised of two or more waveguide sectionscoupled using bulk coupling optics, irrespective of a type of opticalcoupling between the chips or waveguide sections. The term “p/njunction” includes p/i/n junctions having an intrinsic region betweenp-doped and n-doped rejoin. The term “planar waveguide” refers to awaveguide formed upon a planar substrate, and encompasses waveguideswith lateral optical confinement in the plane of the substrate, such asfor example ridge waveguides. The terms “light” and “optical” are usedherein to refer to any electromagnetic radiation having a wavelengthfrom the deep ultraviolet to the far infra-red. In fact, it will beappreciate that the present invention could be implemented for use withalmost any wavelength of radiation; for example microwave or x-rayradiation.

One aspect of the present disclosure relates to an optical waveguidesystem that includes one or more optical waveguides which internalnon-idealities lead to a level of back reflection that may besignificant, and typically harmful, for the overall system performance.Examples include waveguide systems in the form of a single PLC chip, asequence of PLC chips, or a system combining one or more PLC chips andoptical fibers, and generally optical waveguides and waveguide systemswith multiple reflection points spread along the waveguide path. Opticalwaveguides to which the description hereinbelow pertains may besingle-mode or multi-mode, including waveguide paths which are composedof single-mode waveguides followed by multi-mode waveguides, or viceversa. It will be appreciated that the terms “single-mode” and“multi-mode” refer to the number of guided modes of electromagneticradiation supported by the waveguide in the operating wavelength rangeof the optical waveguide system being described. The reflection pointsmay be due to Raleigh scattering associated with the surface roughnessof the waveguide, other distributed waveguide defects or fluctuation ofmaterial properties, or may be in the form of a sequence of connectionsbetween various waveguide devices, sections, or chips. In the context ofthe present disclosure, all such distributed back reflections will bereferred to as optical back scattering.

With reference to FIG. 1A, there is schematically illustrated an opticalwaveguide 10 with an input end 11 and an output end 15, which receivesinput light 21 in its input end 11. The optical waveguide 10, which maybe either single-mode or multi-mode, includes a plurality of scatteringdefects 35 that scatter small fractions of the input light back towardsthe input end 11, forming backscattered light 31 wherein light scatteredfrom all these defects is added together. When the input light 21 has acoherence length that exceeds the length of the waveguide, the scatteredlight portions in each waveguide mode are added coherently, and theoptical field E_(r) of the backscattered light 31 at the input end 11 ofthe waveguide 10 can be expressed as

E _(r)=Σ(A _(n) *R _(n) *B _(n)*exp(2iϕ _(n)))  (1

where A_(n) denotes an amplitude of the incident optical field at n-thscattering center, B_(n) denotes the optical loss of the back-scatteredlight between the scattering center and a point at which thebackscattered light is being measured, R_(n) is a reflectivity of n-thscattering center, and ϕ_(n) is an optical phase delay of the inputlight at the n-th scattering center. The effects related to a finitecoherence length of the input light may be accounted for by including arandomly fluctuating additive phase in ϕ_(n). The summation index in theright hand side (RHS) of equation (1) is n, i.e. the summation isperformed over all scattering centers. Equation (1) directly relates toa single-mode waveguide, while for multi-mode waveguides it may beviewed as describing backscattering in each of the guided modes of thewaveguide, with the parameters A_(n), B_(n), R_(n) and ϕ_(n) beinggenerally mode-dependent.

With reference to FIG. 1B, there is illustrated an example simulatedspectrum of the optical power P_(r)=|E_(r)|² of the backscattered lightin a single-mode SOI waveguide with the following parameters: the lengthof the waveguide L=0.5 cm, linear optical loss in the waveguide=2 dB/cm,a plurality of scattering centers whose reflection magnitude isnormally-distributed with a standard deviation σ=0.002, and the totalnumber of scattering centers or defects in the waveguide N=1000. Thedefects are assumed to be evenly distributed along the waveguide, whichtypically holds for Raleigh scattering on refractive index fluctuationsand core surface roughness.

As can be seen from FIG. 1B, the back reflection power variessignificantly across the spectrum, with deep troughs where the backreflected power may drop by as much as 20 dB and even more. Mostcommunication systems operate at one specific operating wavelength or afew specific operating wavelengths. Thus, the back reflection aresignificantly reduced if the operating wavelength or wavelengths ofinterest coincides with one of the deep troughs or minima of the backscattering spectrum where the back-reflected signal is weak, orequivalently by shifting one of the deeper minima of the back-reflectedspectrum to match the wavelength or wavelengths of interest present inthe input light.

One way to modify or shift the spectrum of the back scattered light atthe waveguide's input end 11 is to adjust an optical phase of thebackscattered light at one or more middle points in the waveguide, oralong at least a middle portion of the waveguide. FIG. 1A illustrates byway of example a middle point or cross-section 13 in the waveguide 10where the optical phase of the backscattered light may be adjusted, forexample by varying the effective refraction index of a length of thewaveguide at the corresponding location, or by inserting at thatlocation a tunable phase shifter. The wording ‘middle point,” “middlelocation,” or “middle portion” of a waveguide does not necessarily referto an exact or even approximate center of the waveguide along itslength, but is used to indicate that said point, location, or portionshould be suitably away from either end of a waveguide length alongwhich the back scattering occurs.

By way of example, the effect of shifting the optical phase of lightpropagating through cross-section 13 of the waveguide 10 by a phaseshift Δϕ₁ on the optical field E_(r) of the backscattered light 31 atthe input end 11 of the waveguide 10 can be expressed as

E _(r)(Δϕ)=C ₁+exp(2iΔϕ ₁)C ₂  (2)

where

C ₁=Σ₁(A _(n) *R _(n) *B _(n)*exp(2iϕ _(n)))  (3)

and

C ₂=Σ₂(A _(n) *R _(n) B _(n)*exp(2iϕ _(n)))  (4)

Here C₁ and C₂ represent the contribution of the waveguide's lightscattering defects located to the left from the phase shift location 13and to the right from the phase shift location 13, respectively, and thesummation in the RHS of equations (3) and (4) is performed overscattering centers along the respective first, or “left,” section 41 ofthe waveguide 10 and the second, or “right,” section 42 of the waveguide10. If the phase shifting location 13 along the waveguide is suitablyselected, the optical power Pr of the reflected light, P_(r)=|E_(r)|²,at the input end 11 of the waveguide 10 may be substantially reduced byadjusting the phase shift Δϕ₁ so that the two terms on the RHS ofequation (2) add in counter phase to interfere destructively at adesired wavelength.

FIGS. 14A to 14D show box plots illustrating simulation results for adistribution of attainable return loss (RL) improvement in dependence ona position of a tunable phase shifter along the 0.5 cm long model SOIwaveguide of FIG. 1A with for four different values of the waveguideloss. The horizontal axis in each figure indicates the tuner locationmeasured in a fraction of the total length of the waveguide. Thedistributions are over one thousand wavelengths in a wavelength rangefrom 1540 nm to 1560 nm. Each data point in a distribution representsthe maximum RL improvement that is attainable for a particularwavelength by optimizing the phase shift at the indicated location. Eachof the vertical boxes spans from the top of the first data quartile (Q1)to the top of the third data quartile (Q3), with the horizontal linesegments within each box indicating the median. The height of each boxrepresents the inner quartile range (IQR) containing half of all datapoints. The top whisker is at [Q2+1.5*(Q2−Q1)].

As can be seen from the box plots, according to the simulations themaximum RL improvement that is attainable by adding an optimum phaseshift at some point along the waveguide may significantly depend on theoperating conditions, such as the wavelength of the propagating light,or likely the device temperature, and at any location along most of thewaveguide length may exceed 5-10 dB or even 15 dB at some wavelength.For the relatively lower-loss waveguides (FIGS. 14A, 14B) locating atunable phase shifter anywhere along a middle portion of the waveguide,starting after the first ˜15% of the waveguide length and spanning up tothe last ˜20% of the waveguide length, may result in an expected medianRL improvement in the range from ˜3 dB to ˜8 dB, with a maximumimprovement exceeding 20 dB, and can potentially be even as high as30-40 dB, depending on the operating wavelength; phase tuner locationsalong the middle third of the waveguide length appear to provide atleast 3 dB RL improvement for most of the wavelengths. For the high-losswaveguides (FIGS. 14C, 14D) optimum tuner locations are understandablycloser to the input end of the waveguide as the back reflections fromthe waveguide locations farther away from the input end are stronglyattenuated, so that locating a tunable phase shifter as close to theinput end as at the 5% of the waveguide length may provide a medium RLimprovement of about 3 dB, with the IQR up to 8-10 dB and a maximumimprovement exceeding 15 dB.

One way to accomplish the desired control of optical back scattering isto monitor the back scattered light 31 at a desired location along thewaveguide path, and adjust the tunable phase shift Δϕ₁ to minimize,reduce, or at least stabilize the monitored optical power. The locationof the monitoring point may be, for example, at or near an input port ofthe waveguide system, such as at or near the input end 11 of thewaveguide 10.

With reference to FIG. 2, there is illustrated an example opticalwaveguide system (OWS) 100 that includes features enabling control ofthe optical back scattering therein. The OWS 100 includes an inputoptical waveguide port 111 configured to receive input light 21, anoutput optical waveguide port 115, and at least one optical waveguide110 disposed to guide the input light 21 along an optical waveguide path33 from the input port 111 to the output port 115. In operation theinput light 21, while propagating towards the output port 115, ispartially converted into backscattered light 131 that propagates in thereverse direction towards the input waveguide port 111. What remains ofthe input light 21, exits the waveguide 110 from the output waveguideport 115 as output light 22. The input waveguide port 111 may be, forexample, in the form of an input end of the waveguide 110, such as forexample an end of a planar waveguide at an edge of an optical chip. Itcan also be in any other suitable form enabling light to be injectedinto the waveguide 110, for example the input port 111 may be in theform of an optical waveguide grating, or a directional optical coupler.Similarly, the output port 115 may also be in the form of a waveguideend, or an output optical coupler, or the like. The output waveguideport 115 may optionally terminate with an integrated optical device 188,such as for example a photodetector, a mirror, or any other opticalterminal device or element.

The OWS 100 may further include one or more photodetectors (PD), such asa feedback photodetector (PD) 151, also referred to herein as the firstPD 151, and an optional forward PD 152, also referred to herein as thesecond PD 152. An optical coupler 145 may be disposed at or near theinput waveguide port 111 so as to tap off a portion 133 of thebackscattered light 131 and to couple the tapped-off portion 133 of thebackscattered light, also referred to as the tapped-off light 133, intothe first PD 151. A fraction of the input light 21 may be optionallycoupled by the same coupler 145 or a different optical coupler into theforward PD 152 when desired to monitor the input light 21. The first PD151 has an electrical PD port 143 which in operation outputs anelectrical PD signal 141, also referred to herein as the firstelectrical PD signal, which may be denoted as S₁ and which is responsiveto variations in an optical power of the tapped-off light 133 receivedby the PD 151, and hence to variations in the backscattered light 131.

The OWS 100 further includes at least one optical phase tuner 140 thatis configured to act upon the optical waveguide 110 so as to vary anoptical phase of light propagating in the waveguide in response to oneor more electrical control signals 141. The optical phase tuner 140 maybe configured to vary an optical length of at least a middle portion ofthe optical waveguide 110. This may be accomplished, for example, byvarying the refractive index of at least a portion of the opticalwaveguide 110 using one of known approaches, such as those based onthermal-optic, electro-optic, and magneto-optic effects wherein therefractive index of a length of the waveguide is varied by changing itstemperature, by applying an electrical or magnetic field, or by changinga concentration of electrical charge carriers in a section of thewaveguide.

The function of generating the phase control signal 144 and varying itin dependence at least in part upon the first PD signal 141 may beperformed by a controller 160 that is electrically connected to thefeedback PD 151 and the optical phase tuner 140, providing aphase-controlling feedback loop. In one embodiment, the controller 160may be configured to vary the electrical control signal 144 so as tominimize, or at least decrease, the first electrical PD signal 141,which is indicative of the optical power P₁ of the back scattered light131 at the optical coupler 145. In one embodiment, the controller 160may be further connected to the second PD 152 and may receive a secondPD signal S₂ 142 therefrom that is indicative of the optical power P₂ ofthe forward-propagating input light 21. In this embodiment thecontroller 160 may also be configured to vary the phase control signalor signals 144 so as to minimize or at least reduce a return opticalloss RL of the OWS 100. The return optical loss RL can be measured orestimated from a ratio k of the first PD signal 141, which is indicativeof the backscattered light 133, to the second PD signal 142:

$\begin{matrix}{k = {\left. \frac{S_{1}}{S_{2}} \right.\sim\frac{P_{1}}{P_{2}}}} & (5)\end{matrix}$

Here S₁ and S₂ may represent, for example, photocurrents generated bythe first and second PDs 151, 152 in response to light they receive,respectively. Thus, in one embodiment the controller 160 may beconfigured to measure the return optical loss RL of the OWS and tocontrol, e.g. minimize it, by varying the electrical phase controlsignal 144. The return optical loss, expressed in decibels, may beestimated as

RL=10 log₁₀ k+C _(coupler),  (6)

where C_(coupler) is a constant that depends on the couplingcoefficients of the optical coupler 145 and conversion efficiencies ofthe PDs 151, 152.

It will be appreciated that the controller 160 may be embodied usingdigital or analog circuitry which may implement a variety of controlalgorithms known in the art, including but not limited to anycombination of proportional, integral, and derivative control, parameteradaptive control, or robust control optimization.

In some embodiments, the control algorithm implemented by the controller160 may use known techniques for finding the smallest minimum among aplurality of minima in the dependence of S₁ or κ upon the phase controlsignal 144. In some embodiments, the control algorithm may use knowndata related to the spectral response of the system with regards toenvironmental and operating parameters to find optimal input/outputrelationships and path dependencies. For example, the controller 160 maystore data mapping the return loss as a function of temperature,wavelength, and phase tuner response. Based on this functional mapping,the control algorithm may initialize the phase tuner at a phase shiftthat enables low return loss as the temperature changes or thewavelength drifts. Furthermore, the initialized phase shift may allowthat the controller to optimally minimize the return loss across a widetemperature range in the presence of a limited phase shift controlrange. By way of example, if the total phase shift control range for thephase tuner exceeds 2π, so that there are multiple optimal values of thephase control signal 144 that minimize the return loss within thecontrol range, the controller 160 may be configured to initialize thephase tuner at a point where it is more likely to stay within the phaseshift control range when temperature changes, based on the storedmapping of the RL versus temperature.

In some embodiments, the controller 160 may be configured to dither thephase control signal 144 and thereby to dither the optical phase Δϕ ofthe light in the waveguide 110, and to detect a signature of the dithersignal in the electrical PD signal 141. The controller 160 may forexample superimpose a dither signal, such as for example a low-frequencymodulation tone, on a cw component of the control signal 144, detect thedither signal or tone in the first PD signal 141, and to vary the cwcomponent of the control signal 144 so as to reduce the strength of thedither tone in the first PD signal 141. The frequency of the dither tonemay be, for example, in a kilohertz range, or generally as desired inthe system design. In some embodiments, the strength of the dithersignal recorded in the first PD signal 141 may be normalized to thesecond PD signal 142 so as to make the control algorithm independent ofpossible changes in the optical power of the input light 21.

In one embodiment, the optical phase tuner 140 may be in the form of atunable local phase shifter that is disposed at a selected location in amiddle portion of the waveguide 110 and configured to selectively shiftan optical phase of light propagating in the waveguide 110 at theselected waveguide location by a variable optical phase shift Δϕ inresponse to the phase control signal 144. Referring to a section 121 ofthe waveguide 110 between the input port 111 and the phase shifter 140as the first waveguide section 121 and a section of the waveguide 110between the phase shifter 140 and the output port 115 as the secondwaveguide section 122, in one embodiment the location of the phaseshifter 140 along the waveguide 110 may be selected so that, at thecoupler 145, the strength of backscattering light originating in thefirst waveguide section 121 and the strength of backscattering lightoriginating in the second waveguide section 122 are approximately equal,and therefore can approximately cancel each other by a suitableselection of the optical phase shift Δϕ produced by the phase shifter140. Here the strength of the backscattered light may refer to theoptical power of the backscattered light at a particular operatingwavelength or temperature. In some cases, for example in the presence ofa small number of known reflection artifacts, it may be estimated fromknown parameters of the optical waveguide, such as the waveguidegeometry and length, optical loss of the waveguide, and theback-scattering coefficient in the waveguide in an operating wavelengthrange.

In one embodiment, the location along the waveguide path 33 where theoptical phase tuner 140 adds the variable optical phase shift Δϕ to thelight propagating in the waveguide may be selected so as to enable atleast 3 dB, and preferably at least 10 dB variation of the optical powerP₁ of the tapped-off portion of the back-scattered light 133 by varyingthe optical phase shift Δϕ. In one embodiment, the location wherein theoptical phase is adjusted by the phase tuner 140, may be selected so asto maximize the sensitivity of the return loss RL, for example as can bemeasured by the controller 160, to the optical phase variations Δϕ.

In the example embodiment described herein the optical coupler 145 maybe disposed close to the input port 111, so that optical backscatteringthat happens in a section of the waveguide 110 between the input port111 and the coupler 145, which is not compensated by the phase controlloop, is below an acceptable backscattering level for the system. Inother embodiments the optical coupler 145 may be disposed away from theinput port 111, and may also be disposed optically prior to the inputport 111. Generally, when the optical coupler 145 is disposed in thewaveguide path 33, it may be disposed at, or suitably close to, alocation along the waveguide path where the backscattered light is to becontrolled in accordance with design requirements of a particular systemimplementation.

The optical waveguide 110, although schematically illustrated in FIG. 2by way of example as a section of a linear optical waveguide, in variousembodiments may vary in configuration along the optical path 33 and mayinclude one or more optical waveguide devices such as waveguidecouplers, resonators, Mach-Zehnder interferometers (MZI), arraywaveguide gratings, optical polarizers, sensors, and the like, each ofwhich may include defects and irregularities causing back reflections.

Referring to FIG. 3, there is illustrated an embodiment of OWS 100wherein an optical phase tuner in the form of a local tunable phaseshifter 340 is disposed optically in-between a first waveguide device321 and a second waveguide device 322, with the first waveguide device321 embodying the first waveguide section 121 of the OWS 100 of FIG. 2,and the second waveguide device 322 embodying the second waveguidesection 122 of the OWS 100 of FIG. 2, with a waveguide section 311therebetween. Each of the first and second waveguide devices 321, 322may, for example, be in the form of, or include, an optical waveguideinterconnect and/or a functional waveguide device such as an opticalcoupler, an MZI, a polarizer, an optical modulator, an opticalresonator, etc. The local phase shifter 340 in this example embodimentis configured to controllably adjust an optical phase of light as itpropagates between the first waveguide device 321 and the secondwaveguide device 322 in either direction.

In one embodiment, the local phase shifter 340 may be for example in theform of an electrical heating element 341 disposed at the selectedlocation at or over the waveguide section 311, as illustrated in FIG.13A. In another embodiment, wherein a waveguide section 311 connectingthe first and second waveguide devices 321, 322 is formed at least inpart of a semiconductor material, such as for example silicon (Si) or acompound semiconductor such as GaAs or InP, or various alloys thereof,the phase shifter 340 may include a p/n junction 343 as illustrated inFIG. 13B, configured to change the concentration of charge carriers inat least a portion of the waveguide section 311, thereby changing itsrefractive index. The local concentration of the charge carriers in thewaveguide 311 may be varied by varying a voltage or current applied tothe electrical contacts 344 of the p/n junction as the phase controlsignal 144. In one embodiment wherein the waveguide section 311connecting the first and second waveguide devices 321, 322 is formed atleast in part of an electro-optic material which refractive indexdepends on electric field, the phase shifter 340 may be in the form ofone or more electrodes 345, illustrated in FIG. 13C, configured tocreate an electric field across at least a portion of the waveguide 311in response to an applied voltage as the phase control signal 144.

Although FIG. 3 shows only one local phase shifter 340, it will beappreciated that other embodiments may use two or more local phaseshifters disposed at various locations along the optical waveguide pathof the input light in the optical waveguide system. In some embodimentsthese locations may be selected so as to ensure, or make likely, thatthe intensity of the back scattered light 133 coupled into the first PD151 is sensitive to the optical phase shift or shifts that may beinduced by the respective local phase shifters disposed at theselocations.

Turning now to FIG. 4 while continuing to refer to FIGS. 2 and 3, thereis schematically illustrated an optical waveguide path 410 formed by(N+1) waveguide sections or devices 321 ₁, 321 ₂, . . . , 321 _(N+1)that are optically connected in series. The optical waveguide path 410,which may be viewed as an embodiment of the waveguide 110 of FIG. 2,further includes a chain of N local phase shifters 340 ₁, 340 ₂, . . . ,340 _(N), where N≥2, disposed along the length of the waveguide path,with each phase shifter 340 n disposed between two consecutive waveguidesections or devices 321 _(n) and 321 _(n+1). Each of the phase shifters340 n may be controlled by a respective phase control signal 144 _(n)from the controller 160 (not shown in FIG. 4) so as to induce an opticalphase shift Δϕ_(n), n=1, . . . , N, at the corresponding location alongthe waveguide path to light propagating in the waveguide. The waveguidepath 410 may be connected between the input optical coupler 145 and theoutput port 115 of the OWS of FIGS. 2 and 3 replacing respectivewaveguides and waveguide devices 110, 310, as illustrated in FIG. 5.

The controller 160 may be configured to dynamically adjust each of thesephase control signals 144 _(n) so as to control back reflections duringthe device operation. For example, in one embodiment the controller 160may be configured to dynamically adjust each, or at least some, of thephase control signals 144 _(n) so as to minimize or at least reduce theback reflections as measured by the first PD 151, possibly normalized tothe input optical power P₂ as measured by the second PD 152, asdescribed hereinabove. Although FIG. 4 shows 3 phase shifters 340 n,this is by way of illustration only, and the number N of the phaseshifters 340 n may vary from as few as one or two to as many as 5-7 ormore, depending on the system design and requirements, e.g., the lengthof the waveguide path 410 and the degree of the desired suppression ofthe back reflections.

In some embodiments the local phase shifters 340 n may be provided atvarious locations along the waveguide path 410, but in operation only afraction of them, or just one, is dynamically tuned to control theintensity of the back scattered light 133 or the return loss. In oneembodiment, the method of the present disclosure for controlling theback scattering may include selecting, at a device calibration stage,which of the N provided phase tuners 340 n exerts the greatest effect onthe back-scattered light 133, and hence should be dynamically controlledin operation by the controller 160. The calibration procedure mayinclude, for example, i) providing the light of a desired operatingwavelength at the input port 111, ii) tuning each of the phase shifters340 n, one by one, across their respective phase tuning range whilemonitoring the PD signal 141, and iii) selecting one of the N phaseshifters 340 n which tuning provided the greatest effect on the PDsignal 141, e.g., the greatest suppression of said signal. In oneembodiment, in operation one or more of the remaining phase shifters 340n may be left uncontrolled or set to provide a constant phase shift,which value may also be optimized during the calibration. In oneembodiment, two or more of the phase shifters 340 n may be selected atthe calibration stage based on their effect on the back-scattered signalor the return loss, and then dynamically tuned in operation by thecontroller 160 to control the back scattering. In some embodiments, theselection of the phase shifter or shifters to dynamically adjust inoperation may change in dependence on the operating wavelength, and/ortemperature. In some embodiments, the controller may select a firstsubset of the tunable local phase shifters 340 n for tuning independence upon the first electrical PD signal 141 when the input lightcomprises a first operating wavelength, and may select a second,different, subset of the tunable local phase shifters 340 n for tuningin dependence upon the first electrical PD signal 141 when the inputlight comprises a second operating wavelength that is different from thefirst wavelength. Each of the first and second subsets may consists ofone or more phase shifters 340 n. In some embodiments, the controller160 may store information indicating which of the phase shifters 340 nto use for various operating wavelengths and/or temperatures. In someembodiments, the selection which of the phase shifters to use for thedynamic control of back reflections may depend on other components thatmay be optically coupled down the path of the waveguide.

Referring to FIG. 13D while continuing to refer to FIG. 5, there isillustrated an embodiment 410 a of the waveguide path 410 which includesa plurality of K>1 local phase tuners formed by a sequence of Kindividually addressable electrodes 345 ₁, 345 ₂, . . . , 345 _(K)disposed at various locations along a waveguide 311. A ground electrode346 may be provided on the opposite side of the waveguide. The waveguide311 may be formed with an electro-optic material which refractive indexvaries in dependence on electrical field. In some embodiments whereinthe waveguide 311 is formed in a semiconductor material, for examplesilicon, the electrodes 345 k, k=1, . . . , K, may provide electricalcontacts to one or more p/n junctions formed in the waveguide 311 asdescribed hereinabove with reference to FIG. 13B. In some embodiments,the electrodes 345 k, k=1, . . . , K, may be replaced by a series ofresistive heaters, as illustrated in FIG. 13A. One or more of theseelectrodes 345 k that provides the greatest effect on the back scatterPD signal 141 may be selected at calibration, and then used by thecontroller 160 in operation to dynamically adjust the optical phase ofthe propagating light with a variable feedback-controlled electricalsignal 144, or two or more such signals if more than one of theelectrodes 345 k are selected, to control the back-scattering, asdescribed hereinabove. In one embodiment, the same variablefeedback-controlled electrical signal 144 may be provided to a selectedsubset of the electrodes 345 k implementing tunable phase shifters. Byway of example, in an embodiment with K=4 electrodes, the controller 160may provide the same control signal 144 to the 1^(st) and 3^(rd)electrodes, as selected based on calibration data for the specificoperating conditions.

Referring now to FIG. 6, there is illustrated an embodiment of the OWS100 that is generally similar to that shown in FIG. 3 but additionallyincludes one or more optical filters 165 in the path of light tapped-offby the optical coupler 145. These optical filters 165 may be useful inembodiments wherein the input light 21 includes multiple wavelengths,such as for example when used in a WDM optical communication system, andit is desired to control the backscattering only for a sub-set of thesewavelengths in a selected wavelength range. In such embodiments, theoptical filter or filters 165 may be configured to pass the selectedwavelength or wavelengths of interest and to block all other wavelengthsthat may be present in the input light 21 outside of the selectedwavelength range.

In each of the example embodiments described herein the optical coupler145 may be implemented in a variety of ways, such as for example, butnot exclusively, as a directional optical coupler, a 2×2 multimodeinterference (MMI) coupler, or a micro-ring waveguide resonator. Each ofthese coupler implementations may be configured to provide a degree ofwavelength selectivity, and therefore may combine optical coupling andoptical filtering functionalities. In embodiment wherein the opticalcoupler 145 is disposed in the path of a multimode waveguide, it may beconfigured to couple out a substantially same fraction of each of theguided modes supported by the waveguide, or it may be configured topreferentially tap off light in one or more selected modes, so as toselectively control the backscattered power into said mode or modes.

Referring to FIG. 7, there is illustrated an example OWS 700 implementedas a planar light wave circuit (PLC) in a PLC chip 705. The PLC 700 maybe viewed as an embodiment of the OWS 100 of FIG. 2, with a planaroptical waveguide 710 embodying the optical waveguide 110 of the OWS 100of FIG. 2. In the illustrated example embodiment, the planar opticalwaveguide 710 terminates at opposing edges of the chip 705, with a firstwaveguide end 711 of the waveguide 710 proving the input optical port,and the second waveguide end 712 providing the output optical port. Itwill be appreciated that in other embodiments the optical ports may beprovided by waveguide ends terminating at the same edge of the chip, orwith one or both of the optical ports configured for optical couplingfrom the top surface of the chip. In some embodiments, the outputwaveguide port 715 may terminate with an optical device integrated inthe PLC chip 705. The planar optical waveguide 710 further includes afirst waveguide section 721 and a second waveguide section 722 connectedin series, with a local optical phase shifter 740 disposed between them.

The local phase shifter 740 may be embodied, for example, using anelectrical heating element, an electrode pair, or a p/n junction, asdescribed hereinabove with reference to the phase shifter 340 of FIG. 3and further with reference to FIGS. 13A-13C. Each of the first andsecond waveguide sections 721 and 722 may be in the form of, or include,an optical waveguide interconnect and/or a functional optical waveguidestructure or device such as, for example, an optical coupler, an opticalmodulator, an MZI, a resonator, a polarizer, a sensor, or the like.

The PLC 700 further includes a micro-ring resonator 745 that isoptically coupled to the planar optical waveguide 710 near the input end711 thereof. The micro-ring resonator 745 embodies the input opticalcoupler 145 of the OWS 100. The micro-ring resonator 745 is opticallycoupled to a tap-off waveguide 755 which guides tapped-off forward andback propagating light to optical monitoring ports 751 of the chip. Thetapped off back-propagating and forward-propagating light is thencoupled to the monitoring PDs 151 and 152, respectively, which functionsare generally as described hereinabove with reference to FIGS. 2 and 3.

The PLC chip 705 may be, for example, a SOI chip, a compoundsemiconductor chip, or it can be made with a dielectric electro-opticmaterial such for example lithium niobate (LiNbO3) or lithium tantalate(LiTaO3). By way of example, PLC chip 705 may be a SOI chip with the PLC710 formed by high-contrast planar waveguides with waveguide coresdefined in the silicon layer thereof.

The micro-ring structure 745 functions generally as a four-portdirectional coupler in that it taps off a portion of the backscatteringlight propagating towards the input port 711 and a portion of forwardpropagating input light 21 and directs them towards monitoring PDs 151and 152, respectively, except it provides an additional wavelengthselectivity related to micro-ring resonances which are known in the art;this additional wavelength selectivity can be utilized to directpredominantly a specific wavelength or wavelengths towards themonitoring PDs, which provides wavelength selectivity to the feedbackloop facilitated by the controller 160 and enables adjusting the opticalphase shift Δϕ induced by the phase shifter 740 so as to suppress theoptical back-scattering specifically at the selected wavelengths. In oneembodiment, the micro-ring 745 may include a wavelength tuning element713, generally in the form of an optical phase shifter that may begenerally similar in design to the optical phase shifter 740, to tune aresonance of the micro-ring to a desired wavelength at which thebackscattering in the PLC 710 is to be suppressed.

The micro-ring 745, or any other suitable optical tap-off coupler orcouplers that may be used in its place, should be disposed close to theinput port 711, so that optical backscattering that happens in a sectionof the waveguide between the input port 711 and the micro-ring 746,which is not compensated by the control loop, is below an acceptablebackscattering level for the system.

The monitoring PDs 151 and 152 may be external to the PLC chip 705, ormay be integrated within the PLC chip 705, for example in the form ofp/n or p/i/n junction diodes. In some embodiments, wherein the PLC chip705 is fabricated using a CMOS compatible technology, the electricalcircuitry of the controller 160 may also be integrated in part or fullywith the PLC chip 705.

Although FIG. 7 shows the PLC 700 implemented in a single chip, it willbe appreciated that in other embodiments the same or similar PLC may beimplemented in two or more PLC chips optically coupled together inseries to form a single waveguiding path, and the local phase shifter740 may be used to control optical scattering that happens along alength of that waveguiding path that spans the two or more PLC chips.For example, the waveguiding sections 721 and 722 of the PLC 710 of FIG.7 may be disposed in two different PLC chips, with the optical phaseshifter 740 formed in either one of these chips or being in the form ofan additional element or PLC chip disposed optically between the chipsembodying the first and second waveguiding sections.

Embodiments described hereinabove with reference to FIGS. 3-7 controloptical back scattering using one or more local phase shifters that areconfigured to add a tunable optical phase shift at a specific locationin the waveguide, or at a series of such locations. Other embodimentsmay include optical phase tuners that effect optical phase changes alonga substantial portion of the waveguide's length, or substantiallyeverywhere in the waveguide, thereby changing how light reflected backfrom various imperfections within the waveguide interfere with eachother. One way to tune the relative phases of the back scatterinterference, and thus to effectively shift the backscattering spectrumin wavelength, is to change the temperature of the waveguide as a whole,or at least of a substantial portion of it. This may be accomplished,for example, using a temperature control element disposed to be inthermal contact with at least a middle length portion of the at leastone optical waveguide of the OWS and configured to vary a temperature inthe waveguide in response to the electrical control signal. Such atemperature control element may be for example in the form of anelectric heater or a thermo-electric cooler (TEC). The electrical heatermay be configured to heat the entire chip embodying the OWS or a portionthereof, or in the form of a resistive heater disposed to heat a portionof a length of the at least one optical waveguide at one or morelocations along the length of the waveguide, as illustrated in FIG. 13A.

By way of example, FIG. 10 illustrates the shift of the optical spectrumof a waveguide return loss (RL) versus waveguide temperature for anexample silicon waveguide structure formed in a SOI wafer, as measuredfor temperatures ranging from 20C to 40C (degree Celsius). In thisexample, the temperature shift of the return loss spectrum isapproximately 70 pm per degree Celsius. Using the temperature inducedshift of the RL spectrum such as that illustrated in FIG. 10, a feedbacksystem may be established whereby the temperature of the chip iscontrolled in order to adjust the return loss spectrum to a favorableposition.

Turning now to FIG. 8, there is schematically illustrated an embodimentof the OWS 100 of FIG. 1 wherein the optical phase tuner 140 is in theform of a temperature control element 840 that is configured to controlthe waveguide temperature along at least a substantial portion of thefull length of the waveguide 110. In one embodiment, the temperaturecontrol element 840 may be in the form of an electrical heating elementthat is in a thermal contact with the waveguide 110 along the wholelength of the waveguide. In one embodiment, the temperature controlelement 840 may be in the form of a thermo-electric controller (TEC)upon which a chip comprising the waveguide 110 is disposed. Thecontroller 160 may be configured to adjust the temperature in thewaveguide 110 in dependence upon the first PD signal 141, optionallynormalized to the second PD signal 142, so as to minimize, or at leastreduce that signal, thereby minimizing or reducing the return loss ofthe OWS.

With reference to FIG. 9, there is schematically illustrated anembodiment wherein a PLC chip 905, with a PLC including a waveguidedevice 910 formed therein, is mounted on a TEC 930. An input opticalcoupler 945 disposed near an input waveguide port 911 taps off a portionof backscattering light that is reflected back from the waveguide device910 towards the input port 911, and directs the tapped-off light towardsa reflection monitoring PD 951. The electrical PD signal 141 from the PD951 is sent to the controller 160, which generates a TEC control signal944 that regulates a temperature setting for the TEC 930. The controller160 may be configured to adjust the TEC control signal 944 in dependenceon the received PD signal 141 so as to minimize or at leastsubstantially reduce it, thereby minimizing or reducing thebackscattering signal at the input port 911. In one embodiment a secondmonitoring PD (not shown) may be provided to monitor variations in theinput light 21, and the controller 160 may be configured to adjust thephase shifter 740 so as to control, e.g., minimize, the ratio of the twoPD signals, and thereby to control the ratio of the backscatteredoptical power to the input optical power, as described hereinabove. Inone embodiment the waveguide device 910 may include a local tunablephase shifter 940 disposed at a selected location along a constituentwaveguide of the waveguide device 910, generally as describedhereinabove, and the controller 160 may be configured to use a phasecontrol signal 144 to tune the phase shifter 940 in dependence on the PDsignal 141 to control the back reflections and/or the return loss fromthe waveguide device. In one embodiment, the controller 160 may adjustthe TEC temperature, for example in dependence on the input wavelength,to increase the efficiency of the local phase shifter 940 incontrolling, for example minimizing, the back reflections and/or the TL.In some embodiments the TEC 930 may be replaced by an electrical heatingelement configured to heat at least a significant portion of thewaveguide device, such as the described hereinabove with respect to FIG.8, which can be operated to optimize the efficiency of the local phaseshifter 940 for specific operating conditions, such as the environmentaltemperature and/or the operating wavelength.

Various example embodiments described hereinabove with reverence toFIGS. 1-9 may be configured to implement a method or methods forcontrolling optical power of back scattered light in a respective OWSincluding at least one optical waveguide, which generally includesvarying an optical phase of light propagating in the waveguide tocontrol the back scattered power at or near an input optical port of theOWS, or at any other desired location along the waveguide path.

With reference to FIG. 11, this method in one embodiment thereof,generally referred to as method 200, may be described as follows. Themethod may start once input light is injected into an input end or portof the at least one optical waveguide, as indicated at 210. Whilepropagating along the waveguide towards an output end thereof, the inputlight is being partially converted into backscattered light, with theback scattered light propagating towards the input end or port of thewaveguide. At 215, a portion of the back scattered light propagatingtowards the input port is tapped off, for example at or near the inputport, to form a tapped-off light, which is coupled into a firstmonitoring photodetector (PD) as indicated at 220. In some embodiments,a portion of the input light may be directed to a second monitoring PDfor controlling variations in the input light.

At 225, an electrical PD signal or signals from the first and,optionally, second PD are measured. The electrical PD signal from thefirst PD is responsive to an amount of the tapped-off light received bythe first PD. The at least one waveguide is acted upon at step 230 so asto control the electrical PD signal from the first PD, or a signalderived therefrom, for example to minimize or reduce it. This acting maygenerally include varying an optical phase of the backscattered light atone or more waveguide locations along a length of the at least oneoptical waveguide. In one embodiment, the optical phase of lightpropagating in the at least one optical waveguide may be adjusted so asto control the electrical PD signal from the first PD normalized to theelectrical PD signal from the second PD, so as to eliminate the effectsof variations in the input optical power.

Embodiments described hereinabove utilize a feedback circuit composed ofa tap-off coupler, a photodetector, a controller, and an optical phasetuner to minimize or at least reduce the optical power of thebackscattered light at a desired point in a system, such as at or nearan input optical port of an OWS. However in some embodiments it may besufficient to stabilize an average value of the backscattered power at anearly constant acceptable level so as to avoid sudden jumps in thebackscattered power, which may happen for example due to environmentalor system fluctuations in view of the presence of strong undulations ofthe backscattered spectrum, as can be seen from FIG. 1A. Suchstabilization of the backscattered light may be achieved, for example,by dithering the optical phase of light propagating in the waveguide ina suitably broad range so that the peaks in the wavelength dependence ofthe scattered optical power become substantially averaged out orsmeared. Such embodiments may operate without any feedback from themeasured backscattered power to the optical phase tuner, so that inputoptical coupler tapping-off the backscattered light, such as coupler 145of the OWS 100 of FIG. 2, and the first PD 151 monitoring said light,may be omitted. The function of the controller 160 may be simply todither the phase control signal 144 with a desired frequency andamplitude.

Referring to FIG. 12, accordingly in one embodiment the method forcontrolling the optical power of the backscattered light in an OWSincluding at least one optical waveguide may include substantially thefollowing two main steps: a) injecting light into input optical port ofthe OWS at step 310, and b) acting upon the at least one opticalwaveguide to dither an optical phase of light propagating in thewaveguide at one or more locations in the waveguide. This may includedithering an optical length of at least a middle portion of thewaveguide so as to keep an average value of the optical power of thebackscattered light at the input port at a constant level. Here,‘average value’ means time averaging over several periods of the phasedither signal. The amplitude of the phase dither signal may be selectedto achieve an averaging of the return loss spectrum, such as that shownin FIG. 1, over several peaks and valley thereof at a specific operatingwavelength or wavelengths present in the input light.

This method may be implemented in any of the example embodimentsdescribed hereinabove with reference to FIGS. 2-9, by suitablyconfiguring the controller 160 to dither the phase control signal orsignals 144 or 944 with a desired frequency and amplitude. It will beappreciated that local optical phase shifter such as those exploitingthe dependence of the reflective index of the waveguide on theelectrical field, magnetic field, of charge carrier concentration mayenable higher-frequency optical phase dithering and thus be preferablein some embodiments to those based on dithering device temperature.

It will be appreciated that any of the embodiments described hereinabovemay incorporate features of the other embodiments. For example, controlalgorithms described hereinabove with reference to a specific embodimentmay also be used in other described embodiment or their variations. Thatmay include utilizing both a TEC and one or more local optical phaseshifter to adjust propagation conditions in the optical waveguide orwaveguides of the OWS so as to reduce the optical power of the backscattered light at the input port. In another example, instead ofminimizing, reducing, or stabilizing the backscattered optical power asdescribed hereinabove with reference to specific example embodiments,the method and system herein described may be used to control thebackscattered light in other ways, as may be desired in some specificsystems, for example to maximize or increase the backscattered power,for example for sensing applications. Those skilled in the art would beable to configure the controller 160 with a control algorithm suitableto accomplish the desired mode of optical back scatter control. Thecontroller 160 may be implemented on the same chip with the OWSmonolithically, on a different chip or chips in the same package, or asa separate analog or digital circuitry outside the package. Furthermore,the controller 160 may implement a control algorithm based on a varietyof metrics, besides those described hereinabove, depending on arequirement of a particular system. For example, the controller 160 maybe configured to maintain the return loss below a pre-defined level.Furthermore, although various embodiments described hereinabove utilizea second PD optically coupled to the OWS to detect variations in theinput light and to estimate the return loss of the OWS, in otherembodiments the controller 160 may receive information about the inputoptical power level elsewhere, for example from an optical systempreceding the OWS, which may then be used to estimate the return loss,so that the second PD, such as the PD 152 of OWS 100 of FIG. 2, may beomitted.

The above-described exemplary embodiments are intended to beillustrative in all respects, rather than restrictive, of the presentinvention. Indeed, various other embodiments and modifications to thepresent disclosure, in addition to those described herein, will beapparent to those of ordinary skill in the art from the foregoingdescription and accompanying drawings. Thus, such other embodiments andmodifications are intended to fall within the scope of the presentdisclosure. For example, it will be appreciated that the opticalwaveguide systems described herein may be implemented using dielectricmaterial, such as glass or lithium niobate, and different semiconductormaterials, including but not limited to silicon, as well as variouscompound semiconductor materials of groups commonly referred to as A3B5and A2B4, such as GaAs, InP, and their alloys and compounds. Furthermorethe optical waveguide system wherein with the backscattering control inaccordance with the present disclosure may include planar opticalwaveguides, such as those that could be formed on semiconductor ordielectric substrates, such as SOI or glass, and/or non-planar opticalwaveguides, such as optical fibers. The input light received by theoptical waveguide systems described therein may include light of one ormore polarizations, and the systems may be configured to suppress lightin one of the received polarizations and in all of the receivedpolarizations. For example, in some embodiments the filters 165 in thewaveguide system of FIG. 6 may be replaced by a polarizer or apolarization controller so as to enable controlling the back-scatteringsignal of a selected polarization. Furthermore, some embodiments mayinclude an optical local oscillator source and an optical mixer disposedprior to the monitoring PD for mixing the back-scattered light with thelight from the optical local oscillator source.

Although the theoretical description given herein is thought to becorrect, the operation of the devices described and claimed herein doesnot depend upon the accuracy or validity of the theoretical description.That is, later theoretical developments that may explain the observedresults on a basis different from the theory presented herein will notdetract from the inventions described herein.

While the present invention has been particularly shown and describedwith reference to the preferred mode as illustrated in the drawing, itwill be understood by one skilled in the art that various changes indetail may be affected therein without departing from the spirit andscope of the invention as defined by the claims.

1-20. (canceled)
 21. A method for controlling back scattering of inputlight in an optical waveguide system, the method comprising: coupling aportion of backscattered light into a first photodetector (PD), thebackscattered light produced by back-scattering of the input light inthe optical waveguide system; and, acting upon at least one opticalwaveguide in the optical waveguide system so as to vary an optical phaseof the backscattered light at one or more locations along the at leastone optical waveguide in dependence upon a first electrical PD signalfrom the first PD, or a signal derived at least in part therefrom, so asto control an optical power of the portion of the backscattered lightcoupled into the first PD.
 22. The method of claim 21, wherein theacting comprises adjusting a temperature of at least a portion of the atleast one optical waveguide in dependence upon the first electrical PDsignal.
 23. The method of claim 21, including measuring a return opticalloss of the optical waveguide system based at least in part upon thefirst electrical PD signal, wherein the acting is performed so as toreduce the return optical loss at an operating wavelength.
 24. Themethod of claim 21 wherein the at least one optical waveguide comprisestwo waveguide sections optically connected in sequence, and wherein theacting comprises changing the optical phase of the backscattered lightbetween the two waveguide sections.
 25. The method of claim 21 whereinthe acting comprises locally varying a refractive index of the at leastone optical waveguide at the one or more locations.
 26. The method ofclaim 25 comprising tapping off the portion of the backscattered lightat or near an input port to form first tapped-off light, wherein theacting comprises varying the optical phase of the backscattered light independence at least in part upon the first electrical PD signal so as todecrease, or at least stabilize, the optical power of the backscatteredlight at the input port.
 27. The method of claim 25 wherein the actingcomprises: varying a refractive index of the at least one opticalwaveguide at the one or more locations by: applying an electricalvoltage or current at the one or more locations responsive to the firstelectrical PD signal, or heating the at least one optical waveguide atthe one or more locations responsive to the first electrical PD signal.28. The method of claim 21 comprising providing a plurality of tunablelocal phase shifters disposed at a plurality of locations in the opticalwaveguide system, wherein the acting comprises selecting a first subsetof the tunable local phase shifters for tuning in dependence upon thefirst electrical PD signal when the input light comprises a firstoperating wavelength, and selecting a second subset of the tunable localphase shifters for tuning in dependence upon the first electrical PDsignal when the input light comprises a second operating wavelength thatis different from the first operating wavelength, wherein the secondsubset is different from the first subset.
 29. The method of claim 21for controlling the back scattering in a selected wavelength range,further comprising blocking wavelengths of the backscattered lightoutside of the selected wavelength range from coupling into the firstPD.
 30. The method of claim 23 comprising measuring an optical power ofthe input light to determine the optical return loss.